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IEC 61967-8:2023 ED2

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method IEC 61967-8:2023 ED2

Publication date:   May 3, 2023

General information

60.60 Standard published   May 3, 2023

IEC

TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics

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Scope

IEC 61967-8:2023 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This edition includes the following significant technical changes with respect to the previous edition:
a) frequency range of 150 kHz to 3 GHz was deleted from the scope;
b) extension of upper usable frequency to 6 GHz or higher as long as the defined requirements are fulfilled.

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PREVIOUSLY

WITHDRAWN
IEC 61967-8:2011 ED1

NOW

PUBLISHED
IEC 61967-8:2023 ED2
60.60 Standard published
May 3, 2023