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IEC 61967-8:2011 ED1

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method IEC 61967-8:2011 ED1

Publication date:   Aug 11, 2011

General information

99.60 Withdrawal effective   May 3, 2023

IEC

TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics

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Revised

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Scope

IEC 61967-8:2011 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement.

This publication is to be read in conjunction with IEC 61967-1:2002.

Life cycle

NOW

WITHDRAWN
IEC 61967-8:2011 ED1
99.60 Withdrawal effective
May 3, 2023

REVISED BY

PUBLISHED
IEC 61967-8:2023 ED2