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IEC 61967-6:2002 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method IEC 61967-6:2002 ED1

Publication date:   Jun 24, 2008

General information

60.60 Standard published   Jun 25, 2002

IEC

TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics

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Scope

Specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz. The contents of the corrigendum of August 2010 have been included in this copy.

Life cycle

NOW

PUBLISHED
IEC 61967-6:2002 ED1
60.60 Standard published
Jun 25, 2002

CORRIGENDA / AMENDMENTS

PUBLISHED
IEC 61967-6:2002/AMD1:2008 ED1

PUBLISHED
IEC 61967-6:2002/COR1:2010 ED1