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IEC 61967-6:2002/COR1:2010 ED1

Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method IEC 61967-6:2002/COR1:2010 ED1

General information

60.60 Standard published   Aug 30, 2010

IEC

TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics

Life cycle

PREVIOUSLY

PUBLISHED
IEC 61967-6:2002 ED1

NOW

PUBLISHED
IEC 61967-6:2002/COR1:2010 ED1
60.60 Standard published
Aug 30, 2010