0

IEC 61967-6:2002/COR1:2010 ED1

Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method IEC 61967-6:2002/COR1:2010 ED1

General information

60.60   Standard published   Aug 30, 2010

IEC

TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics

Life cycle

PREVIOUSLY

PUBLISHED
IEC 61967-6:2002 ED1

NOW

PUBLISHED
IEC 61967-6:2002/COR1:2010 ED1
60.60 Standard published
Aug 30, 2010




Access Genorma App Everywhere

Get fast and easy access to top European and International standards (EN, ISO, IEC) via your mobile phone, tablet or the web.

Google Play App Store Web Version