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IEC 61967-6:2002/AMD1:2008 ED1

Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method IEC 61967-6:2002/AMD1:2008 ED1

Publication date:   Mar 12, 2008

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60.60 Standard published   Mar 12, 2008

IEC

TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics

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IEC 61967-6:2002 ED1

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IEC 61967-6:2002/AMD1:2008 ED1
60.60 Standard published
Mar 12, 2008