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IEC 61967-4:2021 ED2

Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method

Publication date:   Mar 16, 2021

General information

60.60 Standard published   Mar 16, 2021

IEC

TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics

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Scope

IEC 61967-4:2021 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods ensure a high degree of reproducibility and correlation of EME measurement results. This edition includes the following significant technical changes with respect to the previous edition:
- frequency range of 150 kHz to 1 GHz has been deleted from the title;
- recommended frequency range for 1 Ω method has been reduced to 30 MHz;
- Annex G with recommendations and guidelines for frequency range extension beyond 1 GHz has been added.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 61967-4:2002 ED1

WITHDRAWN
IEC 61967-4:2002/AMD1:2006 ED1

WITHDRAWN
IEC 61967-4:2002/COR1:2017 ED1

NOW

PUBLISHED
IEC 61967-4:2021 ED2
60.60 Standard published
Mar 16, 2021