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IEC 61967-4:2002 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method IEC 61967-4:2002 ED1

Publication date:   Apr 30, 2002

General information

99.60 Withdrawal effective   Mar 16, 2021

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IEC

TC 47/SC 47A

International Standard

31.200   Integrated circuits. Microelectronics

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Revised

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Scope

Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.
The contents of the corrigendum 1 of June 2017 have been included in this copy.

Life cycle

NOW

WITHDRAWN
IEC 61967-4:2002 ED1
99.60 Withdrawal effective
Mar 16, 2021

CORRIGENDA / AMENDMENTS

WITHDRAWN
IEC 61967-4:2002/AMD1:2006 ED1

WITHDRAWN
IEC 61967-4:2002/COR1:2017 ED1

REVISED BY

PUBLISHED
IEC 61967-4:2021 ED2