60.60 Standard published Mar 16, 2021
IEC
International Standard
31.200 Integrated circuits. Microelectronics
Published
IEC 61967-4:2021 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods ensure a high degree of reproducibility and correlation of EME measurement results. This edition includes the following significant technical changes with respect to the previous edition:
- frequency range of 150 kHz to 1 GHz has been deleted from the title;
- recommended frequency range for 1 Ω method has been reduced to 30 MHz;
- Annex G with recommendations and guidelines for frequency range extension beyond 1 GHz has been added.
WITHDRAWN
IEC 61967-4:2002 ED1
WITHDRAWN
IEC 61967-4:2002/AMD1:2006 ED1
WITHDRAWN
IEC 61967-4:2002/COR1:2017 ED1
PUBLISHED
IEC 61967-4:2021 ED2
60.60
Standard published
Mar 16, 2021