IEC 60749-9:2017 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking IEC 60749-9:2017 ED2

Publication date:   Mar 3, 2017

General information

60.60 Standard published   Mar 3, 2017


TC 47

International Standard

31.080.01   Semiconductor devices in general



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IEC 60749-9:2017 is to determine whether the marks on solid state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of solvents and cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board manufacturing process.
This test is applicable for all package types. It is suitable for use in qualification and/or process monitor testing. The test is considered non-destructive. Electrical or mechanical rejects can be used for the purpose of this test.
This edition includes the following significant technical changes with respect to the previous edition:
a) revision to Clause 4 Equipment by a complete rewriting of Clause 3 Terms and definitions;
b) additional variant – ‘adhesive tape pull test’.

Life cycle


IEC 60749-9:2002 ED1

IEC 60749-9:2002/COR1:2003 ED1


IEC 60749-9:2017 ED2
60.60 Standard published
Mar 3, 2017