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IEC 60749-5:2003 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Publication date:   Jan 17, 2003

General information

99.60 Withdrawal effective   Apr 10, 2017

WPUB   

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

Buying

  Revised

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Scope

Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC PAS 62161:2000 ED1

WITHDRAWN
IEC 60749:1996 ED2

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IEC 60749:1996/AMD1:2000 ED2

WITHDRAWN
IEC 60749:1996/AMD2:2001 ED2

NOW

WITHDRAWN
IEC 60749-5:2003 ED1
99.60 Withdrawal effective
Apr 10, 2017

REVISED BY

WITHDRAWN
IEC 60749-5:2017 ED2