IEC 60749-4:2002/COR1:2003 ED1
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) IEC 60749-4:2002/COR1:2003 ED1
General information
99.60
Withdrawal effective
Mar 3, 2017
WPUB
IEC
TC 47
International Standard
31.080.01
Semiconductor devices in general
Scope
Modification of the validity date: now put at 2007.
Life cycle
NOW
WITHDRAWN
IEC 60749-4:2002/COR1:2003 ED1
99.60
Withdrawal effective
Mar 3, 2017