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IEC 60749-30:2005/AMD1:2011 ED1

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing IEC 60749-30:2005/AMD1:2011 ED1

Publication date:   May 25, 2011

General information

99.60 Withdrawal effective   Aug 17, 2020

WPUB   

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

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IEC 60749-30:2005 ED1

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IEC 60749-30:2005/AMD1:2011 ED1
99.60 Withdrawal effective
Aug 17, 2020

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IEC 60749-30:2020 ED2