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IEC 60749-11:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

Publication date:   Apr 12, 2002

General information

60.60 Standard published   Apr 12, 2002

IEC

TC 47

International Standard

31.080.01   Semiconductor devices in general

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Scope

Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. The contents of the corrigenda of January 2003 and August 2003 have been included in this copy.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC PAS 62185:2000 ED1

WITHDRAWN
IEC 60749:1996 ED2

WITHDRAWN
IEC 60749:1996/AMD1:2000 ED2

WITHDRAWN
IEC 60749:1996/AMD2:2001 ED2

NOW

PUBLISHED
IEC 60749-11:2002 ED1
60.60 Standard published
Apr 12, 2002

CORRIGENDA / AMENDMENTS

PUBLISHED
IEC 60749-11:2002/COR1:2003 ED1

PUBLISHED
IEC 60749-11:2002/COR2:2003 ED1