IEC PAS 62185:2000 ED1

Name: IEC PAS 62185:2000 ED1
Brand: IEC
SKU: IEC PAS 62185:2000 ED1
Price: 24.2 EUR
Availability: InStock
Rating: 4 (79 reviews)

Thermal shock test method IEC PAS 62185:2000 ED1

Publication date: Aug 22, 2000

95.99 Withdrawal of Standard Jul 1, 2002

General information

Current stage: 95.99 Withdrawal of Standard Jul 1, 2002

Originator: IEC

Owner: TC 47

Type: Publicly Available Specification

ICS: 31.080.01 Semiconductor devices in general

Buying

Status: Replaced

Scope

This test is conducted to determine the resistance of a part to sudden exposure to extreme changes in temperature and to the effect of alternate exposures to these extremes.

Life cycle

NOW

WITHDRAWN
IEC PAS 62185:2000 ED1
95.99 Withdrawal of Standard
Jul 1, 2002

REVISED BY

PUBLISHED
IEC 60749-11:2002 ED1