60.60 Standard published Sep 25, 2020
CENELEC
European Norm
31.080.01 Semiconductor devices in general
Published
<!-- NEW! -->IEC 60749-30:2020 is available as <a href="https://webstore.iec.ch/publication/67474">IEC 60749-30:2020 RLV</a> which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.</br></br>IEC 60749-30:2020 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing.
The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple solder reflow operation.
These SMDs are subjected to the appropriate preconditioning sequence described in this document prior to being submitted to specific in-house reliability testing (qualification and/or reliability monitoring) in order to evaluate long term reliability (impacted by soldering stress). This edition includes the following significant technical changes with respect to the previous edition:
- inclusion of new Clause 3;
- expansion of 6.7 on solder reflow;
- inclusion of explanatory notes and clarifications.
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PUBLISHED
EN IEC 60749-30:2020
60.60
Standard published
Sep 25, 2020
