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EN 60749-30:2005/A1:2011

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing EN 60749-30:2005/A1:2011

Publication date:   Sep 21, 2011

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99.60 Withdrawal effective   Sep 21, 2023

CENELEC

CLC/SR 47 Semiconductor devices

European Norm

31.080.01   Semiconductor devices in general

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EN 60749-30:2005/A1:2011
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EN IEC 60749-30:2020