EN 62418:2010

Name: EN 62418:2010
Brand: CENELEC
SKU: EN 62418:2010
Price: 31.61 EUR
Availability: InStock
Rating: 5 (82 reviews)

Semiconductor devices - Metallization stress void test

Publication date: Sep 16, 2010

General information

Current stage: 60.60 Standard published Jul 9, 2010

Originator: CENELEC

Owner: CLC/TC 47X

Type: European Norm

ICS: 31.080 Semiconductor devices

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Status: Published

PDF - €31.61

Languages: English

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Scope

IEC 62418:2010 describes a method of metallization stress void test and associated criteria. It is applicable to aluminium (Al) or copper (Cu) metallization.

Life cycle

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PUBLISHED
EN 62418:2010
60.60 Standard published
Jul 9, 2010