EN 62374-1:2010/AC:2011

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers EN 62374-1:2010/AC:2011

General information

Current stage: 60.60 Standard published Apr 1, 2011

Originator: CENELEC

Owner: CLC/SR 47 Semiconductor devices

Type: European Norm

ICS: 31.080 Semiconductor devices

Life cycle

PREVIOUSLY

PUBLISHED
EN 62374-1:2010

NOW

PUBLISHED
EN 62374-1:2010/AC:2011
60.60 Standard published
Apr 1, 2011