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EN 62374-1:2010/AC:2011

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers EN 62374-1:2010/AC:2011

General information

60.60   Standard published   Apr 1, 2011

CENELEC

CLC/TC 47X

European Norm

31.080   Semiconductor devices

Life cycle

PREVIOUSLY

PUBLISHED
EN 62374-1:2010

NOW

PUBLISHED
EN 62374-1:2010/AC:2011
60.60 Standard published
Apr 1, 2011




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