EN 61967-4:2002

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method EN 61967-4:2002

Publication date:   Nov 20, 2003

General information

99.60 Withdrawal effective   Apr 20, 2024

CENELEC

CLC/SR 47A Integrated circuits

European Norm

31.200   Integrated circuits. Microelectronics

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Scope

Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.

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WITHDRAWN
EN 61967-4:2002
99.60 Withdrawal effective
Apr 20, 2024

CORRIGENDA / AMENDMENTS

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EN 61967-4:2002/A1:2006

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EN 61967-4:2002/AC:2017-07

REVISED BY

PUBLISHED
EN IEC 61967-4:2021