Standards search

Use the form below to find particular standards or projects. Enter your criteria for searching (single or in combination) in the fields below and press the button “Search”. You can also search using the Advance Search facility.

Integrated circuits - Manufacturing line approval application guideline

60.60 Standard published

CLC/SR 47A

Integrated circuits - Memory devices pin configurations

60.60 Standard published

CLC/SR 47A

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method

60.60 Standard published

CLC/SR 47A

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method

60.60 Standard published

CLC/SR 47A

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

60.60 Standard published

CLC/SR 47A

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

60.60 Standard published

CLC/SR 47A

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

60.60 Standard published

CLC/SR 47A

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

60.60 Standard published

CLC/SR 47A

Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method

60.60 Standard published

CLC/SR 47A

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method

60.60 Standard published

CLC/SR 47A

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method

60.60 Standard published

CLC/SR 47A

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method

60.60 Standard published

CLC/SR 47A

Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method

60.60 Standard published

CLC/SR 47A

Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers

60.60 Standard published

CLC/SR 47A

EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)

60.60 Standard published

CLC/SR 47A

EMC IC modelling - Part 3: Models of Integrated Circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)

60.60 Standard published

CLC/SR 47A

EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)

60.60 Standard published

CLC/SR 47A

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions

60.60 Standard published

CLC/SR 47A