60.60 Standard published Apr 30, 2021
CENELEC
European Norm
31.200 Integrated circuits. Microelectronics
Published
<!-- NEW! -->IEC 61967-4:2021 is available as <a href="https://webstore.iec.ch/publication/68739">IEC 61967-4:2021 RLV</a> which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.</br></br>IEC 61967-4:2021 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods ensure a high degree of reproducibility and correlation of EME measurement results. This edition includes the following significant technical changes with respect to the previous edition:
- frequency range of 150 kHz to 1 GHz has been deleted from the title;
- recommended frequency range for 1 Ω method has been reduced to 30 MHz;
- Annex G with recommendations and guidelines for frequency range extension beyond 1 GHz has been added.
WITHDRAWN
EN 61967-4:2002
WITHDRAWN
EN 61967-4:2002/A1:2006
WITHDRAWN
EN 61967-4:2002/A1:2006/corrigendum Dec. 2006
WITHDRAWN
EN 61967-4:2002/AC:2017-07
PUBLISHED
EN IEC 61967-4:2021
60.60
Standard published
Apr 30, 2021
