Menu

0

EN 60749-5:2017

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

Publication date:   Oct 17, 2017

General information

60.60 Standard published   Jul 7, 2017

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

Buying

  Published

PDF - €23.81

  English  



Buy

Scope

IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.

This edition includes the following significant technical changes with respect to the previous edition:

a)   correction of an error in an equation;

b)   inclusion of notes for guidance;

c)   clarification of the applicability of test conditions.

Life cycle

PREVIOUSLY

WITHDRAWN
EN 60749-5:2003

NOW

PUBLISHED
EN 60749-5:2017
60.60 Standard published
Jul 7, 2017

REVISED BY

PUBLISHED
EN IEC 60749-5:2024