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EN 60749-5:2003

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test EN 60749-5:2003

Publication date:   Dec 22, 2003

General information

99.60 Withdrawal effective   May 15, 2020

CENELEC

CLC/SR 47 Semiconductor devices

European Norm

31.080.01   Semiconductor devices in general

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Scope

Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

Life cycle

NOW

WITHDRAWN
EN 60749-5:2003
99.60 Withdrawal effective
May 15, 2020

REVISED BY

PUBLISHED
EN 60749-5:2017