60.60 Standard published Aug 25, 2006
CENELEC
European Norm
31.080.01 Semiconductor devices in general
Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive
PUBLISHED
EN 60749-27:2006
60.60
Standard published
Aug 25, 2006
PUBLISHED
EN 60749-27:2006/A1:2012