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EN 60749-27:2006/A1:2012

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) EN 60749-27:2006/A1:2012

Publication date:   Jan 22, 2013

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60.60   Standard published   Nov 9, 2012

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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60.60 Standard published
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