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prEN IEC 60749-7:2024

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases

Publication date:   Oct 18, 2024

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40.60 Close of voting   Nov 29, 2024

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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prEN IEC 60749-7:2024
40.60 Close of voting
Nov 29, 2024