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prEN IEC 60749-26:2024

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) prEN IEC 60749-26:2024

Publication date:   Nov 29, 2024

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40.20 DIS ballot initiated: 12 weeks   Nov 29, 2024

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

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EN IEC 60749-26:2018

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prEN IEC 60749-26:2024
40.20 DIS ballot initiated: 12 weeks
Nov 29, 2024