0

prEN IEC 60749-25

Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling prEN IEC 60749-25

General information

10.99   New project approved   Aug 31, 2026

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

Life cycle

PREVIOUSLY

PUBLISHED
EN 60749-25:2003

NOW

IN_DEVELOPMENT
prEN IEC 60749-25
10.99 New project approved
Aug 31, 2026




Access Genorma App Everywhere

Get fast and easy access to top European and International standards (EN, ISO, IEC) via your mobile phone, tablet or the web.

Google Play App Store Web Version