EN 60749-25:2003

Semiconductor devices - Mechanical and climatic test methods - Part 25: Temperature cycling EN 60749-25:2003

Publication date:   Jul 30, 2004

Scope

Provides a test procedure for determining the ability of semiconductor devices and components and/or board assemblies to withstand mechanical stresses induced by alternating high and low temperature extremes. Permanent changes in electrical and/or physical characteristics can result from these mechanical stresses. Applies to single, dual and triple chamber temperature cycling and covers component and solder interconnection testing.