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prEN IEC 60749-23:2024

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

General information

40.20 DIS ballot initiated: 12 weeks   Nov 22, 2024

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

Life cycle

PREVIOUSLY

PUBLISHED
EN 60749-23:2004

PUBLISHED
EN 60749-23:2004/A1:2011

NOW

IN_DEVELOPMENT
prEN IEC 60749-23:2024
40.20 DIS ballot initiated: 12 weeks
Nov 22, 2024