Menu

0

prEN IEC 60749-22-2

Semiconductor devices - Mechanical and climatic test methods - Part 22-2: Bond strength - Wire bond shear test methods

General information

10.99 New project approved   Nov 11, 2024

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

Life cycle

NOW

IN_DEVELOPMENT
prEN IEC 60749-22-2
10.99 New project approved
Nov 11, 2024