Menu

0

prEN IEC 60749-21:2024

Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability

Publication date:   Oct 18, 2024

General information

40.60 Close of voting   Nov 29, 2024

CENELEC

CLC/TC 47X

European Norm

31.080.01   Semiconductor devices in general

Buying

  Draft

PDF - €15.80

  English  



Buy

Life cycle

PREVIOUSLY

PUBLISHED
EN 60749-21:2011

NOW

IN_DEVELOPMENT
prEN IEC 60749-21:2024
40.60 Close of voting
Nov 29, 2024