60.60 Standard published Nov 6, 2024
ISO
ISO/TC 202/SC 3 Analytical electron microscopy
International Standard
71.040.50 Physicochemical methods of analysis | 37.020 Optical equipment
This document specifies a procedure for the determination of the averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered material. This document does not apply for determining the simulated interface of the multi-layered materials expected through the multi-slice simulation (MSS) method.
This document is applicable to the cross-sectional images of multi-layered materials recorded using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM) and cross-sectional elemental mapping images using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS). This document is also applicable to digitized images recorded on an image sensor built into a digital camera, a digital memory set in the PC or an imaging plate, where the digitalized image is obtained by converting an analogue image recorded on photographic film using an image scanner.
WITHDRAWN
ISO 20263:2017
PUBLISHED
ISO 20263:2024
60.60
Standard published
Nov 6, 2024