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Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy

90.92 Standard to be revised

ISO/TC 202/SC 3

Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials

90.92 Standard to be revised

ISO/TC 202/SC 3

Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis

60.60 Standard published

ISO/TC 202/SC 3

Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy

60.60 Standard published

ISO/TC 202/SC 3

Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope

90.92 Standard to be revised

ISO/TC 202/SC 3

Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures

60.60 Standard published

ISO/TC 202/SC 3

Microbeam analysis — Analytical electron microscopy — Guidelines of specimen preparation for transmission electron microscope using focused ion beam processing

20.00 New project registered in TC/SC work programme

ISO/TC 202/SC 3

Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wire-like crystals by transmission electron microscopy

40.60 Close of voting

ISO/TC 202/SC 3

Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials

40.60 Close of voting

ISO/TC 202/SC 3

Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope

40.00 DIS registered

ISO/TC 202/SC 3

Microbeam analysis — Analytical electron microscopy — The measurement of the dislocation density in thin metals

00.60 Close of review

ISO/TC 202/SC 3