ISO/FDIS 17297

Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary ISO/FDIS 17297

General information

50.00 Final text received or FDIS registered for formal approval   Nov 21, 2024

ISO

ISO/TC 202/SC 1 Terminology

International Standard

01.040.71   Chemical technology (Vocabularies) | 71.040.50   Physicochemical methods of analysis

Scope

Numbers of FIB applications will soon be available with developments and advancements of FIB instruments including, in-line automatic operation, multiple sample preparation, in-situ lift-out, new ion sources and cryogenic, which are still in their infancy. The manufacturers/vendors pertaining to this field have technical characteristics to offer their unique features in terms of instrument technology. Due to such conditions, entities to be newly involved in this technical field are anticipated to increase, and there exists a risk of random development of technologies exploiting the essence of FIB. In the light of the situation where several different words are used for the same function of FIB, this standard defines unified terminology necessary to the FIB processing

Life cycle

NOW

IN_DEVELOPMENT
ISO/FDIS 17297
50.00 Final text received or FDIS registered for formal approval
Nov 21, 2024