Standards search

Use the form below to find particular standards or projects. Enter your criteria for searching (single or in combination) in the fields below and press the button “Search”. You can also search using the Advance Search facility.

Microbeam analysis — Analytical electron microscopy — Vocabulary

90.60 Close of review

ISO/TC 202/SC 1

Microbeam analysis — Scanning electron microscopy — Vocabulary

90.60 Close of review

ISO/TC 202/SC 1

Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary

90.60 Close of review

ISO/TC 202/SC 1

Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary

50.00 Final text received or FDIS registered for formal approval

ISO/TC 202/SC 1

Microbeam Analysis — Electron Backscatter Diffraction — Vocabulary

30.60 Close of voting/ comment period

ISO/TC 202/SC 1