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Microbeam analysis — Analytical electron microscopy — Vocabulary

90.60 Close of review

ISO/TC 202/SC 1

Microbeam analysis — Scanning electron microscopy — Vocabulary

90.20 Standard under periodical review

ISO/TC 202/SC 1

Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary

90.60 Close of review

ISO/TC 202/SC 1

Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary

40.99 Full report circulated: DIS approved for registration as FDIS

ISO/TC 202/SC 1

Microbeam Analysis — Electron Backscatter Diffraction — Vocabulary

30.20 CD study/ballot initiated

ISO/TC 202/SC 1