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ISO 6342:2003

Micrographics — Aperture cards — Method of measuring thickness of buildup area ISO 6342:2003

Publication date:   Jul 15, 2003

General information

90.60   Close of review   Jun 5, 2026

ISO

ISO/TC 171 Document management applications

International Standard

37.080   Document imaging applications

Buying

Published

Language in which you want to receive the document.

Scope

ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.

Life cycle

PREVIOUSLY

WITHDRAWN
ISO 6342:1993

NOW

PUBLISHED
ISO 6342:2003
90.60 Close of review
Jun 5, 2026




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