0

ISO 6342:1993

Micrographics — Aperture cards — Method of measuring thickness of buildup area ISO 6342:1993

Publication date:   Aug 5, 1993

95.99   Withdrawal of Standard   Jul 15, 2003

General information

95.99   Withdrawal of Standard   Jul 15, 2003

ISO

ISO/TC 171/SC 2 Document file formats, EDMS systems and authenticity of information

International Standard

37.080   Document imaging applications

Buying

Withdrawn

Language in which you want to receive the document.

Scope

The method specified determines the buildup thickness of the aperture card as the difference between the thickness of the buildup area and the thickness of the card both measured using a micrometer.

Life cycle

NOW

WITHDRAWN
ISO 6342:1993
95.99 Withdrawal of Standard
Jul 15, 2003

REVISED BY

PUBLISHED
ISO 6342:2003




Access Genorma App Everywhere

Get fast and easy access to top European and International standards (EN, ISO, IEC) via your mobile phone, tablet or the web.

Google Play App Store Web Version