95.99 Withdrawal of Standard Dec 6, 2017
ISO
ISO/TC 202/SC 3 Analytical electron microscopy
International Standard
37.020 Optical equipment
ISO 29301:2010 specifies a calibration procedure applicable to images recorded over a wide magnification range in a transmission electron microscope (TEM). The reference materials used for calibration possess a periodic structure, such as a diffraction grating replica, a super-lattice structure of semiconductor or an analysing crystal for X-ray analysis, and a crystal lattice image of carbon, gold or silicon. ISO 29301:2010 is applicable to the magnification of the TEM image recorded on a photographic film, or an imaging plate, or detected by an image sensor built into a digital camera. ISO 29301:2010 also refers to the calibration of a scale bar. ISO 29301:2010 does not apply to the dedicated critical dimension measurement TEM (CD-TEM) and the scanning transmission electron microscope (STEM)
WITHDRAWN
ISO 29301:2010
95.99
Withdrawal of Standard
Dec 6, 2017
WITHDRAWN
ISO 29301:2017