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ISO 18118:2004/NP Amd 1

Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials — Amendment 1 ISO 18118:2004/NP Amd 1

General information

10.98   New project rejected   Apr 3, 2014

ISO

ISO/TC 201/SC 7 Electron spectroscopies

International Standard

71.040.40   Chemical analysis

Life cycle

PREVIOUSLY

WITHDRAWN
ISO 18118:2004

NOW

ABANDON
ISO 18118:2004/NP Amd 1
10.98 New project rejected
Apr 3, 2014




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