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Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
90.20 Standard under periodical review
Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
90.93 Standard confirmed
Surface chemical analysis — Characterization of nanostructured materials
60.60 Standard published
Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
90.60 Close of review
Surface chemical analysis — X-ray photoelectron spectroscopy — Description of selected instrumental performance parameters
90.93 Standard confirmed
Surface chemical analysis — Auger electron spectroscopy — Description of selected instrumental performance parameters
90.93 Standard confirmed
Surface chemical analysis — X-ray photoelectron spectrometers — Calibration of energy scales
90.93 Standard confirmed
Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
90.60 Close of review
Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
60.60 Standard published
Surface chemical analysis — High-resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical-state analysis
90.93 Standard confirmed
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
60.60 Standard published
Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
90.92 Standard to be revised
Surface chemical analysis — Auger electron spectroscopy — Derivation of chemical information
60.60 Standard published
Surface chemical analysis — Electron spectroscopies — Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
90.93 Standard confirmed
Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of methods used for charge control and charge correction
60.60 Standard published
Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials
90.60 Close of review
Surface chemical analysis — Electron spectroscopies — Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
90.93 Standard confirmed
Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
90.60 Close of review
