ISO 14594:2024

Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy

Publication date:   Jun 7, 2024

General information

60.60 Standard published   Jun 7, 2024

ISO

ISO/TC 202/SC 2 Electron probe microanalysis

International Standard

71.040.50   Physicochemical methods of analysis

Buying

  Published

PDF - €116.16

  English  



Buy

Scope

This document gives general guidelines for the determination of experimental parameters relating to the electron probe, the wavelength spectrometer, and the specimen that need to be taken into account when carrying out electron probe microanalysis. It also defines procedures for the determination of probe current, probe diameter, dead time, wavelength resolution, background, analysis area, analysis depth, and analysis volume.
This document is applicable for the analysis of a well-polished specimen using normal beam incidence.
This document does not apply to energy dispersive X-ray spectroscopy.

Life cycle

PREVIOUSLY

WITHDRAWN
ISO 14594:2014

NOW

PUBLISHED
ISO 14594:2024
60.60 Standard published
Jun 7, 2024