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ISO 13084:2011

Surface chemical analysis — Secondary-ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

Publication date:   May 5, 2011

95.99 Withdrawal of Standard   Nov 15, 2018

General information

95.99 Withdrawal of Standard   Nov 15, 2018

ISO

ISO/TC 201/SC 6 Secondary ion mass spectrometry

International Standard

71.040.40   Chemical analysis

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Scope

ISO 13084:2011 specifies a method to optimize the mass calibration accuracy in time-of-flight SIMS instruments used for general analytical purposes. It is only applicable to time-of-flight instruments but is not restricted to any particular instrument design. Guidance is provided for some of the instrumental parameters that can be optimized using this procedure and the types of generic peaks suitable to calibrate the mass scale for optimum mass accuracy.

Life cycle

NOW

WITHDRAWN
ISO 13084:2011
95.99 Withdrawal of Standard
Nov 15, 2018

REVISED BY

PUBLISHED
ISO 13084:2018