IEC PAS 62207:2000 ED1

Hermeticity

Publication date:   Nov 28, 2000

95.99 Withdrawal of Standard   Jan 31, 2002

General information

95.99 Withdrawal of Standard   Jan 31, 2002

IEC

TC 47

Publicly Available Specification

31.080.01   Semiconductor devices in general

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Scope

Aims at determining the effectiveness of the seal of hermetically sealed solid-state devices.
The seal tests are considered nondestructive.

Life cycle

NOW

WITHDRAWN
IEC PAS 62207:2000 ED1
95.99 Withdrawal of Standard
Jan 31, 2002

REVISED BY

WITHDRAWN
IEC 60749:1996/AMD2:2001 ED2