IEC PAS 62191:2000 ED1

Name: IEC PAS 62191:2000 ED1
Brand: IEC
SKU: IEC PAS 62191:2000 ED1
Price: 96.8 EUR
Availability: InStock
Rating: 5 (77 reviews)

Acoustic microscopy for nonhermetic encapsulated electronic components IEC PAS 62191:2000 ED1

Publication date: Nov 28, 2000

95.99 Withdrawal of Standard Jan 31, 2002

General information

Current stage: 95.99 Withdrawal of Standard Jan 31, 2002

Originator: IEC

Owner: TC 47

Type: Publicly Available Specification

ICS: 31.080.01 Semiconductor devices in general

Buying

Status: Replaced

Scope

Defines the procedures for performing acoustic microscopy on nonhermetic encapsulated electronic components. Provides users with an acoustic microscopy process flow for detecting anomalies (delamination, cracks, mold compounds voids, etc.) nondestructively in plastic packages while achieving reproducibility.

Life cycle

NOW

WITHDRAWN
IEC PAS 62191:2000 ED1
95.99 Withdrawal of Standard
Jan 31, 2002

REVISED BY

WITHDRAWN
IEC 60749:1996/AMD2:2001 ED2