IEC PAS 62178:2000 ED1

Temperature cycling

Publication date:   Aug 22, 2000

General information

99.60 Withdrawal effective   Jul 15, 2003

IEC

TC 47

Publicly Available Specification

31.080.01   Semiconductor devices in general

Buying

  Replaced

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  English  



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Scope

This test is conducted to determine the resistance of a part to extremes of high- and low-temperatures and to the effect of alternate exposures to these extremes.

Life cycle

NOW

WITHDRAWN
IEC PAS 62178:2000 ED1
99.60 Withdrawal effective
Jul 15, 2003

REVISED BY

PUBLISHED
IEC 60749-25:2003 ED1