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IEC PAS 62171:2000 ED1

Guidelines for particle impact noise detection (PIND) testing, operator training and certification IEC PAS 62171:2000 ED1

Publication date:   Aug 22, 2000

95.99 Withdrawal of Standard   Mar 15, 2003

General information

95.99 Withdrawal of Standard   Mar 15, 2003

IEC

TC 47

Publicly Available Specification

31.080.01   Semiconductor devices in general

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Replaced

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Scope

Aims at disseminating and sharing the relevant information on PIND testing to all interested parties. The concepts and materials presented here primarily deal with most of the cause factors that affect the "Measurement Variability" pertinent to PIND and how to control them.

Life cycle

NOW

WITHDRAWN
IEC PAS 62171:2000 ED1
95.99 Withdrawal of Standard
Mar 15, 2003

REVISED BY

PUBLISHED
IEC 60749-16:2003 ED1