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IEC PAS 62163:2000 ED1

External visual test method IEC PAS 62163:2000 ED1

Publication date:   Aug 22, 2000

95.99 Withdrawal of Standard   Jul 1, 2002

General information

95.99 Withdrawal of Standard   Jul 1, 2002

IEC

TC 47

Publicly Available Specification

31.080.01   Semiconductor devices in general

Buying

Replaced

Language in which you want to receive the document.

Scope

The purpose of this examination is to verify that the materials, design, construction, markings, and workmanship of the device are in accordance with the applicable procurement document. External Visual is a non-destructive test and applicable for all package types.

Life cycle

NOW

WITHDRAWN
IEC PAS 62163:2000 ED1
95.99 Withdrawal of Standard
Jul 1, 2002

REVISED BY

WITHDRAWN
IEC 60749-3:2002 ED1