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IEC PAS 60679-6:2008 ED1

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide IEC PAS 60679-6:2008 ED1

Publication date:   Feb 27, 2008

General information

99.60 Withdrawal effective   Mar 14, 2011

IEC

TC 49

Publicly Available Specification

31.140   Piezoelectric devices

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Scope

IEC/PAS 60679-6 applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter.

Life cycle

NOW

WITHDRAWN
IEC PAS 60679-6:2008 ED1
99.60 Withdrawal effective
Mar 14, 2011

REVISED BY

WITHDRAWN
IEC 60679-6:2011 ED1