IEC 60679-6:2011 ED1

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines IEC 60679-6:2011 ED1

Publication date:   Mar 14, 2011

95.99 Withdrawal of Standard   Feb 14, 2018

General information

95.99 Withdrawal of Standard   Feb 14, 2018

IEC

TC 49

International Standard

31.140   Piezoelectric devices

Buying

Withdrawn

Language in which you want to receive the document.

Scope

IEC 60679-6:2011 applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter. In the measurement method, phase noise measurement equipment or a phase noise measurement system is used. The measuring frequency range is from 10 MHz to 1 000 MHz. This standard applies to quartz crystal oscillators and SAW oscillators used in electronic devices and modules that have the multiplication or division functions based on these oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. This standard cancels and replaces IEC/PAS 60679-6 published in 2008. This first edition constitutes a technical revision.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC PAS 60679-6:2008 ED1

NOW

WITHDRAWN
IEC 60679-6:2011 ED1
95.99 Withdrawal of Standard
Feb 14, 2018